Taehoon Kim, Jongwook Choi, Hyunjin Cho, HyoungJun Lim, Jongwon Choi. Domain Generalization for Face Forgery Detection by Style Transfer. In IEEE International Conference on Consumer Electronics, ICCE 2024, Las Vegas, NV, USA, January 6-8, 2024. pages 1-5, IEEE, 2024. [doi]
Abstract is missing.