White Box Pairwise Test Case Generation

Jangbok Kim, Kyunghee Choi, Daniel M. Hoffman, Gihyun Jung. White Box Pairwise Test Case Generation. In Seventh International Conference on Quality Software (QSIC 2007), 11-12 October 2007, Portland, Oregon, USA. pages 286-291, IEEE Computer Society, 2007. [doi]

Abstract

Abstract is missing.