Multi-Exposure Image Fusion Based on Patch using Global and Local Characteristics

Jihwan Kim, Hyunho Choi, Jechang Jeong. Multi-Exposure Image Fusion Based on Patch using Global and Local Characteristics. In 41st International Conference on Telecommunications and Signal Processing, TSP 2018, Athens, Greece, July 4-6, 2018. pages 1-5, IEEE, 2018. [doi]

Authors

Jihwan Kim

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Hyunho Choi

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Jechang Jeong

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