Multi-Exposure Image Fusion Based on Patch using Global and Local Characteristics

Jihwan Kim, Hyunho Choi, Jechang Jeong. Multi-Exposure Image Fusion Based on Patch using Global and Local Characteristics. In 41st International Conference on Telecommunications and Signal Processing, TSP 2018, Athens, Greece, July 4-6, 2018. pages 1-5, IEEE, 2018. [doi]

@inproceedings{KimCJ18,
  title = {Multi-Exposure Image Fusion Based on Patch using Global and Local Characteristics},
  author = {Jihwan Kim and Hyunho Choi and Jechang Jeong},
  year = {2018},
  doi = {10.1109/TSP.2018.8441463},
  url = {https://doi.org/10.1109/TSP.2018.8441463},
  researchr = {https://researchr.org/publication/KimCJ18},
  cites = {0},
  citedby = {0},
  pages = {1-5},
  booktitle = {41st International Conference on Telecommunications and Signal Processing, TSP 2018, Athens, Greece, July 4-6, 2018},
  publisher = {IEEE},
  isbn = {978-1-5386-4695-3},
}