CMOS Mixed-Signal Circuit Process Variation Sensitivity Characterization for Yield Improvement - researchr publication authors

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Daeik D. Kim, Choongyeun Cho, Jonghae Kim, Jean-Olivier Plouchart, Robert Trzcinski, David Ahlgren. CMOS Mixed-Signal Circuit Process Variation Sensitivity Characterization for Yield Improvement. In Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, DoubleTree Hotel, San Jose, California, USA, September 10-13, 2006. pages 365-368, IEEE, 2006. [doi]

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