Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure

Young-Pil Kim, U-In Chung, Joo Tae Moon, Sang U. Kim. Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure. Microelectronics Reliability, 43(9-11):1461-1464, 2003. [doi]

Abstract

Abstract is missing.