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Projection moire for 3D inspection of printed circuit boards

Seung-Woo Kim, Yi-Bae Choi, Jung-Taek Oh. Projection moire for 3D inspection of printed circuit boards. In Richard N. Ellson, Joseph H. Nurre, editors, Three-Dimensional Image Capture, San Jose, CA, USA, February 8, 1997. Volume 3023 of SPIE Proceedings, pages 129-138, SPIE, 1997. [doi]

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Seung-Woo Kim

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Yi-Bae Choi

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Jung-Taek Oh

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