Sang-Woon Kim, Robert P. W. Duin. Dissimilarity-Based Classifications in Eigenspaces. In César San Martín, Sang-Woon Kim, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 16th Iberoamerican Congress, CIARP 2011, Pucón, Chile, November 15-18, 2011. Proceedings. Volume 7042 of Lecture Notes in Computer Science, pages 425-432, Springer, 2011. [doi]
@inproceedings{KimD11-2,
title = {Dissimilarity-Based Classifications in Eigenspaces},
author = {Sang-Woon Kim and Robert P. W. Duin},
year = {2011},
doi = {10.1007/978-3-642-25085-9_50},
url = {http://dx.doi.org/10.1007/978-3-642-25085-9_50},
researchr = {https://researchr.org/publication/KimD11-2},
cites = {0},
citedby = {0},
pages = {425-432},
booktitle = {Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 16th Iberoamerican Congress, CIARP 2011, Pucón, Chile, November 15-18, 2011. Proceedings},
editor = {César San Martín and Sang-Woon Kim},
volume = {7042},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-25084-2},
}