Adaptive sample bias for rapidly-exploring random trees with applications to test generation

Jongwoo Kim, Joel M. Esposito. Adaptive sample bias for rapidly-exploring random trees with applications to test generation. In American Control Conference, ACC 2005, Portland, OR, USA, 8-10 June, 2005. pages 1166-1172, IEEE, 2005. [doi]

Authors

Jongwoo Kim

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Joel M. Esposito

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