Hyunsik Kim, Yungseon Eo. High-Frequency-Measurement-Based Frequency-Variant Transmission Line Characterization and Circuit Modeling for Accurate Signal Integrity Verification. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 507-512, IEEE Computer Society, 2007. [doi]
Abstract is missing.