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Understanding Uncertainty in Measurement and Accommodating its Impact in 3D Modeling and Printing

Jeeeun Kim, Anhong Guo, Tom Yeh, Scott E. Hudson, Jennifer Mankoff. Understanding Uncertainty in Measurement and Accommodating its Impact in 3D Modeling and Printing. In Oli Mival, Michael Smyth, Peter Dalsgaard, editors, Proceedings of the 2017 Conference on Designing Interactive Systems, DIS '17, Edinburgh, United Kingdom, June 10-14, 2017. pages 1067-1078, ACM, 2017. [doi]

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Jeeeun Kim

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Anhong Guo

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Tom Yeh

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Scott E. Hudson

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Jennifer Mankoff

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