Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels - researchr publication authors

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Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio Lombardi. Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels. IEEE Trans. Industrial Informatics, 4(2):134-143, 2008. [doi]

This author has not been identified. Look up 'Kyung Ki Kim' in GoogleThis author has not been identified. Look up 'Jing Huang' in GoogleThis author has not been identified. Look up 'Yong-Bin Kim' in GoogleThis author has not been identified. Look up 'Fabrizio Lombardi' in Google

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