Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio Lombardi. Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels. IEEE Trans. Industrial Informatics, 4(2):134-143, 2008. [doi]
@article{KimHKL08:0,
title = {Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels},
author = {Kyung Ki Kim and Jing Huang and Yong-Bin Kim and Fabrizio Lombardi},
year = {2008},
doi = {10.1109/TII.2008.924589},
url = {http://dx.doi.org/10.1109/TII.2008.924589},
tags = {testing, analysis, data-flow, data-flow analysis},
researchr = {https://researchr.org/publication/KimHKL08%3A0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Industrial Informatics},
volume = {4},
number = {2},
pages = {134-143},
}