On using signature registers as pseudorandom pattern generators in built-in self-testing

Kwanghyun Kim, Dong Sam Ha, Joseph G. Tront. On using signature registers as pseudorandom pattern generators in built-in self-testing. IEEE Trans. on CAD of Integrated Circuits and Systems, 7(8):919-928, 1988. [doi]

Authors

Kwanghyun Kim

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Dong Sam Ha

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Joseph G. Tront

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