Kinam Kim, Gi-Tae Jeong, Chan-Woong Chun, Sam-Jin Hwang. DRAM reliability. Microelectronics Reliability, 42(4-5):543-553, 2002. [doi]
@article{KimJCH02,
title = {DRAM reliability},
author = {Kinam Kim and Gi-Tae Jeong and Chan-Woong Chun and Sam-Jin Hwang},
year = {2002},
doi = {10.1016/S0026-2714(02)00030-6},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00030-6},
tags = {reliability},
researchr = {https://researchr.org/publication/KimJCH02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {4-5},
pages = {543-553},
}