Overlap-aware rapid type analysis for constructing one-to-one matched call graphs in regression test selection

Mingwan Kim, Jongwook Jeong, Neunghoe Kim, Hoh Peter In. Overlap-aware rapid type analysis for constructing one-to-one matched call graphs in regression test selection. IET Software, 14(4):423-432, 2020. [doi]

Abstract

Abstract is missing.