Wavelength Shift Measurement With Resonance Characteristic Prediction Algorithm Using Intensities at Discrete Wavelengths

Eudum Kim, Su-Jin Jeon, Sun Ho Kim, Do Hyun Kim, Jae Sang Lee, Young-Wan Choi. Wavelength Shift Measurement With Resonance Characteristic Prediction Algorithm Using Intensities at Discrete Wavelengths. IEEE T. Instrumentation and Measurement, 69(8):5666-5672, 2020. [doi]

Authors

Eudum Kim

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Su-Jin Jeon

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Sun Ho Kim

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Do Hyun Kim

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Jae Sang Lee

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Young-Wan Choi

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