Eudum Kim, Su-Jin Jeon, Sun Ho Kim, Do Hyun Kim, Jae Sang Lee, Young-Wan Choi. Wavelength Shift Measurement With Resonance Characteristic Prediction Algorithm Using Intensities at Discrete Wavelengths. IEEE T. Instrumentation and Measurement, 69(8):5666-5672, 2020. [doi]
@article{KimJKKLC20,
title = {Wavelength Shift Measurement With Resonance Characteristic Prediction Algorithm Using Intensities at Discrete Wavelengths},
author = {Eudum Kim and Su-Jin Jeon and Sun Ho Kim and Do Hyun Kim and Jae Sang Lee and Young-Wan Choi},
year = {2020},
doi = {10.1109/TIM.2019.2962564},
url = {https://doi.org/10.1109/TIM.2019.2962564},
researchr = {https://researchr.org/publication/KimJKKLC20},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {69},
number = {8},
pages = {5666-5672},
}