A Multi-Layered 3D NDT Scan-Matching Method for Robust Localization in Logistics Warehouse Environments

Taeho Kim, Haneul Jeon, Donghun Lee. A Multi-Layered 3D NDT Scan-Matching Method for Robust Localization in Logistics Warehouse Environments. Sensors, 23(5):2671, March 2023. [doi]

Authors

Taeho Kim

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Haneul Jeon

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Donghun Lee

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