A Multi-Layered 3D NDT Scan-Matching Method for Robust Localization in Logistics Warehouse Environments

Taeho Kim, Haneul Jeon, Donghun Lee. A Multi-Layered 3D NDT Scan-Matching Method for Robust Localization in Logistics Warehouse Environments. Sensors, 23(5):2671, March 2023. [doi]

Abstract

Abstract is missing.