Youngtaek Kim, Lizy Kurian John, Sanjay Pant, Srilatha Manne, Michael J. Schulte, William Lloyd Bircher, Madhu Saravana Sibi Govindan. Automating Stressmark Generation for Testing Processor Voltage Fluctuations. IEEE Micro, 33(4):66-75, 2013. [doi]
Abstract is missing.