Young-Il Kim, Chong-Min Kyung. TPartition: Testbench Partitioning for Hardware-Accelerated Functional Verification. IEEE Design & Test of Computers, 21(6):484-493, 2004. [doi]
@article{KimK04:49,
title = {TPartition: Testbench Partitioning for Hardware-Accelerated Functional Verification},
author = {Young-Il Kim and Chong-Min Kyung},
year = {2004},
doi = {10.1109/MDT.2004.101},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.101},
tags = {partitioning},
researchr = {https://researchr.org/publication/KimK04%3A49},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {21},
number = {6},
pages = {484-493},
}