Suyeon Kim, SeongKu Kang, Dongwoo Kim 0002, Jungseul Ok, Hwanjo Yu. Delving into Instance-Dependent Label Noise in Graph Data: A Comprehensive Study and Benchmark. In Luiza Antonie, Jian Pei 0001, Xiaohui Yu 0001, Flavio Chierichetti, Hady W. Lauw, Yizhou Sun, Srinivasan Parthasarathy 0001, editors, Proceedings of the 31st ACM SIGKDD Conference on Knowledge Discovery and Data Mining, V.2, KDD 2025, Toronto ON, Canada, August 3-7, 2025. pages 5539-5550, ACM, 2025. [doi]
Abstract is missing.