Resource Allocation and Design Techniques of Prebond Testable 3-D Clock Tree

Tak-Yung Kim, Taewhan Kim. Resource Allocation and Design Techniques of Prebond Testable 3-D Clock Tree. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(1):138-151, 2013. [doi]

@article{KimK13-0,
  title = {Resource Allocation and Design Techniques of Prebond Testable 3-D Clock Tree},
  author = {Tak-Yung Kim and Taewhan Kim},
  year = {2013},
  doi = {10.1109/TCAD.2012.2212193},
  url = {http://dx.doi.org/10.1109/TCAD.2012.2212193},
  researchr = {https://researchr.org/publication/KimK13-0},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {32},
  number = {1},
  pages = {138-151},
}