Duality between erasures and defects

Yongjune Kim, B. V. K. Vijaya Kumar. Duality between erasures and defects. In 2016 Information Theory and Applications Workshop, ITA 2016, La Jolla, CA, USA, January 31 - February 5, 2016. pages 1-10, IEEE, 2016. [doi]

Abstract

Abstract is missing.