Youngwook Kim, Jae-Myung Kim, Zeynep Akata, Jungwoo Lee 0001. Large Loss Matters in Weakly Supervised Multi-Label Classification. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022. pages 14136-14145, IEEE, 2022. [doi]
Abstract is missing.