Byungwhan Kim, Hee Ju Kwon, Seongjin Choi. Use of adaptive network fuzzy inference system to predict plasma charging damage on electrical MOSFET properties. Expert Syst. Appl., 36(3):6570-6573, 2009. [doi]
@article{KimKC09a,
title = {Use of adaptive network fuzzy inference system to predict plasma charging damage on electrical MOSFET properties},
author = {Byungwhan Kim and Hee Ju Kwon and Seongjin Choi},
year = {2009},
doi = {10.1016/j.eswa.2008.07.034},
url = {http://dx.doi.org/10.1016/j.eswa.2008.07.034},
researchr = {https://researchr.org/publication/KimKC09a},
cites = {0},
citedby = {0},
journal = {Expert Syst. Appl.},
volume = {36},
number = {3},
pages = {6570-6573},
}