Use of adaptive network fuzzy inference system to predict plasma charging damage on electrical MOSFET properties

Byungwhan Kim, Hee Ju Kwon, Seongjin Choi. Use of adaptive network fuzzy inference system to predict plasma charging damage on electrical MOSFET properties. Expert Syst. Appl., 36(3):6570-6573, 2009. [doi]

Abstract

Abstract is missing.