Pattern Recognition through Mathematical Feature analysis and Wavelet Transform

Cheol-Ki Kim, In-Sil Kwak, Eui-Young Cha, Tae-Soo Chon. Pattern Recognition through Mathematical Feature analysis and Wavelet Transform. In Hamid R. Arabnia, Youngsong Mun, editors, Proceedings of the International Conference on Artificial Intelligence, IC-AI 02, June 24 - 27, 2002, Las Vegas, Nevada, USA, Volume 2. pages 656-662, CSREA Press, 2002.

Authors

Cheol-Ki Kim

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In-Sil Kwak

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Eui-Young Cha

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Tae-Soo Chon

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