A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment

Hong Sik Kim, Sungho Kang, Michael S. Hsiao. A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment. J. Electronic Testing, 24(4):365-378, 2008. [doi]

Authors

Hong Sik Kim

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Sungho Kang

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Michael S. Hsiao

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