The classification methodology of chip quality using canonical correlation analysis-based variable selection on chip level data

K. H. Kim, H. S. Kwon, H. I. Hong, H. S. Hwang, K. Y. Cho, G. Y. Jin. The classification methodology of chip quality using canonical correlation analysis-based variable selection on chip level data. In 2015 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2015, Singapore, December 6-9, 2015. pages 381-385, IEEE, 2015. [doi]

Abstract

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