Moonzoo Kim, Yunho Kim, Yoonkyu Jang. Industrial Application of Concolic Testing on Embedded Software: Case Studies. In Giuliano Antoniol, Antonia Bertolino, Yvan Labiche, editors, 2012 IEEE Fifth International Conference on Software Testing, Verification and Validation, Montreal, QC, Canada, April 17-21, 2012. pages 390-399, IEEE, 2012. [doi]
@inproceedings{KimKJ12-0, title = {Industrial Application of Concolic Testing on Embedded Software: Case Studies}, author = {Moonzoo Kim and Yunho Kim and Yoonkyu Jang}, year = {2012}, doi = {10.1109/ICST.2012.119}, url = {http://doi.ieeecomputersociety.org/10.1109/ICST.2012.119}, researchr = {https://researchr.org/publication/KimKJ12-0}, cites = {0}, citedby = {0}, pages = {390-399}, booktitle = {2012 IEEE Fifth International Conference on Software Testing, Verification and Validation, Montreal, QC, Canada, April 17-21, 2012}, editor = {Giuliano Antoniol and Antonia Bertolino and Yvan Labiche}, publisher = {IEEE}, isbn = {978-1-4577-1906-6}, }