Moonzoo Kim, Yunho Kim, Yoonkyu Jang. Industrial Application of Concolic Testing on Embedded Software: Case Studies. In Giuliano Antoniol, Antonia Bertolino, Yvan Labiche, editors, 2012 IEEE Fifth International Conference on Software Testing, Verification and Validation, Montreal, QC, Canada, April 17-21, 2012. pages 390-399, IEEE, 2012. [doi]
Abstract is missing.