Hong Sik Kim, YongJoon Kim, Sungho Kang. Test-decompression mechanism using a variable-length multiple-polynomial LFSR. IEEE Trans. VLSI Syst., 11(4):687-690, 2003. [doi]
@article{KimKK03a,
title = {Test-decompression mechanism using a variable-length multiple-polynomial LFSR},
author = {Hong Sik Kim and YongJoon Kim and Sungho Kang},
year = {2003},
doi = {10.1109/TVLSI.2003.812287},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2003.812287},
tags = {testing},
researchr = {https://researchr.org/publication/KimKK03a},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {11},
number = {4},
pages = {687-690},
}