Unit Testing of Flash Memory Device Driver through a SAT-Based Model Checker - researchr publication authors

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Moonzoo Kim, Yunho Kim, Hotae Kim. Unit Testing of Flash Memory Device Driver through a SAT-Based Model Checker. In 23rd IEEE/ACM International Conference on Automated Software Engineering (ASE 2008), 15-19 September 2008, L Aquila, Italy. pages 198-207, IEEE, 2008. [doi]

This author has not been identified. Look up 'Moonzoo Kim' in GoogleThis author has not been identified. Look up 'Yunho Kim' in GoogleThis author has not been identified. Look up 'Hotae Kim' in Google

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