Moonzoo Kim, Yunho Kim, Hotae Kim. Unit Testing of Flash Memory Device Driver through a SAT-Based Model Checker. In 23rd IEEE/ACM International Conference on Automated Software Engineering (ASE 2008), 15-19 September 2008, L Aquila, Italy. pages 198-207, IEEE, 2008. [doi]
@inproceedings{KimKK08:2,
title = {Unit Testing of Flash Memory Device Driver through a SAT-Based Model Checker},
author = {Moonzoo Kim and Yunho Kim and Hotae Kim},
year = {2008},
doi = {10.1109/ASE.2008.30},
url = {http://dx.doi.org/10.1109/ASE.2008.30},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/KimKK08%3A2},
cites = {0},
citedby = {0},
pages = {198-207},
booktitle = {23rd IEEE/ACM International Conference on Automated Software Engineering (ASE 2008), 15-19 September 2008, L Aquila, Italy},
publisher = {IEEE},
}