Min-Su Kim, Chunghee Kim, Yong-geol Kim, Ah-Reum Kim, Jikyum Kim, Juhyun Kang, Daeseong Lee, Changjun Choi, Ilsuk Suh, Jungyul Pyo, Youngmin Shin, Jae Cheol Son. Single-ended D flip-flop with implicit scan mux for high performance mobile AP. In Karan S. Bhatia, Massimo Alioto, Danella Zhao, Andrew Marshall, Ramalingam Sridhar, editors, 29th IEEE International System-on-Chip Conference, SOCC 2016, Seattle, WA, USA, September 6-9, 2016. pages 91-95, IEEE, 2016. [doi]
@inproceedings{KimKKKKKLCSPSS16,
title = {Single-ended D flip-flop with implicit scan mux for high performance mobile AP},
author = {Min-Su Kim and Chunghee Kim and Yong-geol Kim and Ah-Reum Kim and Jikyum Kim and Juhyun Kang and Daeseong Lee and Changjun Choi and Ilsuk Suh and Jungyul Pyo and Youngmin Shin and Jae Cheol Son},
year = {2016},
doi = {10.1109/SOCC.2016.7905442},
url = {http://dx.doi.org/10.1109/SOCC.2016.7905442},
researchr = {https://researchr.org/publication/KimKKKKKLCSPSS16},
cites = {0},
citedby = {0},
pages = {91-95},
booktitle = {29th IEEE International System-on-Chip Conference, SOCC 2016, Seattle, WA, USA, September 6-9, 2016},
editor = {Karan S. Bhatia and Massimo Alioto and Danella Zhao and Andrew Marshall and Ramalingam Sridhar},
publisher = {IEEE},
isbn = {978-1-5090-1367-8},
}