Rapid fault cause identification in surface mount technology processes based on factory-wide data analysis

Dongil Kim, Jeongin Koo, Hyein Kim, Seokho Kang, Sang Hyun Lee, Jeong-Tae Kang. Rapid fault cause identification in surface mount technology processes based on factory-wide data analysis. IJDSN, 15(2), 2019. [doi]

@article{KimKKKLK19,
  title = {Rapid fault cause identification in surface mount technology processes based on factory-wide data analysis},
  author = {Dongil Kim and Jeongin Koo and Hyein Kim and Seokho Kang and Sang Hyun Lee and Jeong-Tae Kang},
  year = {2019},
  doi = {10.1177/1550147719832802},
  url = {https://doi.org/10.1177/1550147719832802},
  researchr = {https://researchr.org/publication/KimKKKLK19},
  cites = {0},
  citedby = {0},
  journal = {IJDSN},
  volume = {15},
  number = {2},
}