Rapid fault cause identification in surface mount technology processes based on factory-wide data analysis

Dongil Kim, Jeongin Koo, Hyein Kim, Seokho Kang, Sang Hyun Lee, Jeong-Tae Kang. Rapid fault cause identification in surface mount technology processes based on factory-wide data analysis. IJDSN, 15(2), 2019. [doi]

Abstract

Abstract is missing.