A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters

Kicheol Kim, Youbean Kim, Incheol Kim, HyeonUk Son, Sungho Kang. A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. IEICE Transactions, 91-C(4):670-672, 2008. [doi]

Abstract

Abstract is missing.