Jeongho Kim, Taejune Kim, Jeonghyeon Kim, Simon S. Woo. Evading Deepfake Detectors via High Quality Face Pre-Processing Methods. In 26th International Conference on Pattern Recognition, ICPR 2022, Montreal, QC, Canada, August 21-25, 2022. pages 1937-1944, IEEE, 2022. [doi]
@inproceedings{KimKKW22-0,
title = {Evading Deepfake Detectors via High Quality Face Pre-Processing Methods},
author = {Jeongho Kim and Taejune Kim and Jeonghyeon Kim and Simon S. Woo},
year = {2022},
doi = {10.1109/ICPR56361.2022.9956520},
url = {https://doi.org/10.1109/ICPR56361.2022.9956520},
researchr = {https://researchr.org/publication/KimKKW22-0},
cites = {0},
citedby = {0},
pages = {1937-1944},
booktitle = {26th International Conference on Pattern Recognition, ICPR 2022, Montreal, QC, Canada, August 21-25, 2022},
publisher = {IEEE},
isbn = {978-1-6654-9062-7},
}