Kyung Ki Kim, Yong-Bin Kim, Fabrizio Lombardi. Data Dependent Jitter (DDJ) Characterization Methodology. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 294-304, IEEE Computer Society, 2005. [doi]
Abstract is missing.