Parametric model-based noise reduction for ToF depth sensors

Yong Sun Kim, Byongmin Kang, Hwasup Lim, Ouk Choi, KeeChang Lee, James D. K. Kim, Changyeong Kim. Parametric model-based noise reduction for ToF depth sensors. In Atilla Baskurt, Robert Sitnik, editors, Three-Dimensional Image Processing (3DIP) and Applications II, Burlingame, California, USA, January 22, 2012. Volume 8290 of SPIE Proceedings, SPIE, 2012. [doi]

Abstract

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