Transfer learning for automated optical inspection

Seunghyeon Kim, WooYoung Kim, Yung-Kyun Noh, Frank Chongwoo Park. Transfer learning for automated optical inspection. In 2017 International Joint Conference on Neural Networks, IJCNN 2017, Anchorage, AK, USA, May 14-19, 2017. pages 2517-2524, IEEE, 2017. [doi]

Authors

Seunghyeon Kim

This author has not been identified. Look up 'Seunghyeon Kim' in Google

WooYoung Kim

This author has not been identified. Look up 'WooYoung Kim' in Google

Yung-Kyun Noh

This author has not been identified. Look up 'Yung-Kyun Noh' in Google

Frank Chongwoo Park

This author has not been identified. Look up 'Frank Chongwoo Park' in Google