Seunghyeon Kim, WooYoung Kim, Yung-Kyun Noh, Frank Chongwoo Park. Transfer learning for automated optical inspection. In 2017 International Joint Conference on Neural Networks, IJCNN 2017, Anchorage, AK, USA, May 14-19, 2017. pages 2517-2524, IEEE, 2017. [doi]
@inproceedings{KimKNP17,
title = {Transfer learning for automated optical inspection},
author = {Seunghyeon Kim and WooYoung Kim and Yung-Kyun Noh and Frank Chongwoo Park},
year = {2017},
doi = {10.1109/IJCNN.2017.7966162},
url = {https://doi.org/10.1109/IJCNN.2017.7966162},
researchr = {https://researchr.org/publication/KimKNP17},
cites = {0},
citedby = {0},
pages = {2517-2524},
booktitle = {2017 International Joint Conference on Neural Networks, IJCNN 2017, Anchorage, AK, USA, May 14-19, 2017},
publisher = {IEEE},
isbn = {978-1-5090-6182-2},
}