Hee-Yeon Kim, Ji-Hoon Kim, Ho Kyun Oh, Beom-Jin Lee, Si Woo Mun, Jeong-Hoon Shin, Kyounggon Kim. DAPP: automatic detection and analysis of prototype pollution vulnerability in Node.js modules. Int. J. Inf. Sec., 21(1):1-23, 2022. [doi]
Abstract is missing.