Hochul Kim, Kye-Shin Lee. Sigma-delta ADC characterization using noise transfer function pole-zero tracking. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-9, IEEE, 2007. [doi]
Abstract is missing.