Ki-Jin Kim, Seung Ho Lim. Compression and Variable-Sized ECC Scheme for the Reliable Flash Memory System. In James J. Park, Vincenzo Loia, Gangman Yi, Yunsick Sung, editors, Advances in Computer Science and Ubiquitous Computing - CSA/CUTE 2017, Taichung, Taiwan, 18-20 December. Volume 474 of Lecture Notes in Electrical Engineering, pages 1232-1236, Springer, 2017. [doi]
Abstract is missing.