Myeongso Kim, Minyoung Lee, Minjeong An, Hongchul Lee. Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel. J. Intelligent Manufacturing, 31(5):1165-1174, 2020. [doi]
@article{KimLAL20,
title = {Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel},
author = {Myeongso Kim and Minyoung Lee and Minjeong An and Hongchul Lee},
year = {2020},
doi = {10.1007/s10845-019-01502-y},
url = {https://doi.org/10.1007/s10845-019-01502-y},
researchr = {https://researchr.org/publication/KimLAL20},
cites = {0},
citedby = {0},
journal = {J. Intelligent Manufacturing},
volume = {31},
number = {5},
pages = {1165-1174},
}