Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel

Myeongso Kim, Minyoung Lee, Minjeong An, Hongchul Lee. Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel. J. Intelligent Manufacturing, 31(5):1165-1174, 2020. [doi]

Abstract

Abstract is missing.